一起非電量保護(hù)裝置誤動(dòng)原因分析與改進(jìn)
 

陳強(qiáng)林，張鋒，劉曉航，馮佳奇
（許繼電氣股份有限公司，河南 許昌 461000）
 

    摘 要：分析了一起非電量保護(hù)裝置誤動(dòng)事件，對(duì)故障現(xiàn)象、數(shù)據(jù)的分析過程進(jìn)行了闡述，采用了軟、硬件故障模擬方法，最終確定誤動(dòng)原因是由于裝置CPU 插件RAM 內(nèi)存中一位數(shù)據(jù)出錯(cuò)而引起保護(hù)邏輯變化，滿足動(dòng)作條件而誤出口，并從增加閉鎖相關(guān)保護(hù)功能、使用雙CPU 配置、增加重要自檢信息的事件記錄等方面對(duì)類似故障發(fā)生時(shí)的閉鎖及后續(xù)改進(jìn)提供了方法。
    關(guān)鍵詞：非電量保護(hù)；誤動(dòng)；翻轉(zhuǎn)故障；軟件閉鎖
    中圖分類號(hào)：TM77     文獻(xiàn)標(biāo)識(shí)碼：B     文章編號(hào)：1007-3175(2017)04-0040-03
 

Cause Analysis and Improvement of a Case of Non-Electric Quantity Protection Device Misoperation

 

CHEN Qiang-lin, ZHANG Feng, LIU Xiao-hang, FENG Jia-qi
（XJ Electric Co., Ltd, Xuchang 461000, China）
 

    Abstract: This paper analyzed an incident of non-electric quantity protection device misoperation, expounded the analysis procedure of fault phenomenon and data, and adopted the software and hardware fault simulation method. The final determination misoperation cause was the protection logic changes caused by the data error in the plug-in random-access memory (RAM) of device central processing unit (CPU) to meet the movement condition and mis-export. This paper started from the incident records such as increasing the protection function related to interlock, using double CPU configuration, increasing important self-inspection information etc. to provide the methods for the atresia of similar failure and subsequent improvement.
    Key words: non-electric quantity protection; misoperation; reversal fault; software interlock
 

參考文獻(xiàn)
[1] 杜永良，高亞奎. 機(jī)載計(jì)算機(jī)RAM 故障診斷技術(shù)[J].測(cè)控技術(shù)，2015，34(22)：66-69.
[2] 高潔. 常見繼電保護(hù)誤動(dòng)作產(chǎn)生的原因及預(yù)防措施分析[J]. 電子世界，2016(20)：181-183.