運(yùn)行中電流互感器二次線圈匝間短路事故成因分析 

楊宇峰，張鴻國，尤靈偉，范偉健 
杭州交聯(lián)電氣工程有限公司，浙江 杭州 310018 
 

摘 要：針對電流互感器(CT)運(yùn)行中出現(xiàn)的一例零序保護(hù)動(dòng)作事故及開關(guān)柜內(nèi)二次端子局部燒熔現(xiàn)象，采用直流電阻試驗(yàn)和勵(lì)磁特性試驗(yàn)對事故原因進(jìn)行分析，發(fā)現(xiàn)CT二次繞組線圈匝間短路是引起零序電流保護(hù)動(dòng)作的直接原因，而運(yùn)行中CT間歇性開路可能是造成CT二次繞組匝間短路和端子燒熔的原因所在。
關(guān)鍵詞：電流互感器；直流電阻試驗(yàn)；勵(lì)磁特性試驗(yàn)；匝間短路；開路運(yùn)行；過電壓
中圖分類號：TM452 文獻(xiàn)標(biāo)識碼：B 文章編號：1007-3175(2014)04-0041-02

Cause Analysis of Short Circuit Fault Between Secondary WindingTurns in Operational Current Transformer 

YANG Yu-feng, ZHANG Hong-guo, YOU Ling-wei, FAN Wei-jian 
Hangzhou Jiaolian Electric Engineering Co., Ltd, Hangzhou 310018, China 
 

Abstract: Aiming at that a case of zero sequence protective action fault turned up in operational current transformer(CT) and the switchgear internal secondary terminal partial burnt out, this paper adopted DC resistance test and excitation magnetic characteristic test to carry out fault cause analysis, finding that short circuit of CT between secondary winding turns was the direct cause to lead to zero sequence current protective action, moreover the interval open circuit of CT in operation may be the cause to result in short circuit of CT between secondary winding turns and terminals burning-out.
          Key words: current transformer; DC resistance test; excitation magnetic characteristic test; short circuit between winding turns; open circuit operation; overvoltage

參考文獻(xiàn)
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