用100%有功負(fù)載電流替代閉環(huán)電流開(kāi)斷試驗(yàn)的討論
胡醇，楊英杰
（蘇州電器科學(xué)研究院股份有限公司，江蘇 蘇州 215104）
摘 要：為了保證滿足應(yīng)用要求，新設(shè)計(jì)的高壓交流負(fù)荷開(kāi)關(guān)必須進(jìn)行相應(yīng)的型式試驗(yàn)。通過(guò)對(duì)負(fù)荷開(kāi)關(guān)有功負(fù)載電流開(kāi)斷試驗(yàn)瞬態(tài)恢復(fù)電壓受電源側(cè)阻抗占比影響的分析，討論了TDload2試驗(yàn)時(shí)端口TRV參數(shù)等于或者嚴(yán)于TDloop 的TRV參數(shù)的條件，以及滿足TDloop試驗(yàn)條件時(shí)對(duì)TDload2試驗(yàn)嚴(yán)酷度的影響，給出用100% 有功負(fù)載電流試驗(yàn)替代閉環(huán)電流試驗(yàn)的條件，并對(duì)負(fù)荷開(kāi)關(guān)標(biāo)準(zhǔn)中相關(guān)的表述提出修改建議。
關(guān)鍵詞：有功負(fù)載電流試驗(yàn)(TDload2)；閉環(huán)電流試驗(yàn)(TDloop)；瞬態(tài)恢復(fù)電壓(TRV)；電源側(cè)阻抗占比
中圖分類號(hào)：TM564.2；TM83 文獻(xiàn)標(biāo)識(shí)碼：B 文章編號(hào)：1007-3175(2020)03-0049-03
Discussion on the Breaking Test by Replacing the Closed Loop Current with 100% Active Load Current
HU Chun, YANG Ying-jie
（Suzhou Electrical Apparatus Science Academy Co.,Ltd, Suzhou 215104, China）
Abstract: To meet the application requirements, the newly designed high voltage AC load switch must undergo corresponding type tests. By analyzing the effect of supply side impedance ratio on transient recovery voltage (TRV) in active load current breaking test of load switch, the condition that the TRV parameters of open contacts of circuit-breaker in the TDload2 are equal to or stricter than those in the TDloop, and the effect of meeting the condition of TDloop on TDload2 severity were discussed, the condition for replacing the closed loop current test with 100% active load current test was given, and suggestions for modifying the relevant expressions in load switch standard were provided.
Key words: active load current test (TDload2); closed current test (TDloop); transient recovery voltage (TRV); supply side impedance ratio
參考文獻(xiàn)
[1] 全國(guó)高壓開(kāi)關(guān)設(shè)備標(biāo)準(zhǔn)化技術(shù)委員會(huì). 高壓交流負(fù)荷開(kāi)關(guān)：GB/T 3804—2017[S]. 北京：中國(guó)標(biāo)準(zhǔn)出版社，2017：18.
[2] International Electrotechnical Commission. Hign-voltage switchgear and controlgear-Part 103：Switches for rated voltages above 1 kV up to and including 52 kV：IEC 62271-103 Edition 1.0[S].Geneva：International Electrotechnical Commission Publication，2011：28.
